Huake Zhiyuan - Diode surge current refers to the peak or overload current that far exceeds the steady-state current, generated at the moment the power line is connected or under abnormal circuit conditions.

Semiconductor devices may sometimes withstand large impact currents during operation. Depending on the device's application, the required capability to withstand surge currents varies. To test a device's ability to endure surge currents, a large surge current can be generated and applied to the device under test, thereby determining whether it can withstand the impact of high surge currents.

The testing method of Huake Zhiyuan's surge current tester complies with the relevant standards in JB/T7626-2013. The surge current test bench is an important testing equipment for diodes and other related semiconductor devices. This equipment has the following features:

1. This test bench is a high-current, high-voltage testing device with high requirements for electrical performance.

2. The test control of this bench is fully automated, allowing tests to be conducted automatically according to the program set by the operator.

3. This test bench uses a computer to record test results and can convert the results into Excel files for processing.

4. This testing equipment mainly consists of the following units:

a. Surge test unit

b. Blocking parameter test unit

c. Computer control system

II. Technical Conditions

2.1 Environmental Requirements:

1. Ambient temperature: 15—40°C

2. Relative humidity: Storage humidity not exceeding 80%

3. Atmospheric pressure: 86Kpa—106Kpa

4. Altitude: Below 1000 meters

5. Grid voltage: AC220V±10%, no severe harmonics

6. Grid frequency: 50Hz±1Hz

7. Power supply: Less than 1.5KW

8. Grid power factor: >0.9

2.2 Main Technical Indicators:

1. Surge current (I_TSM/I_FSM) test range: 30～1200A; Optional configurations: 3000A, 8000A, 20kA, 50kA, etc.

2. Surge current (I_TSM/I_FSM) accuracy: Display resolution 1A, accuracy ±3%

Surge current (I_TSM/I_FSM) waveform: Approximate sinusoidal half-wave;

3. Surge current base width: 8.3 and 10ms; Optional configurations: 1ms, 10us, etc.

4. Test frequency: Single; Repetitive

5. Reverse voltage (V_RRM) test range: 200～2000V;

6. Reverse voltage (V_RRM) display resolution: 10V, accuracy ±3%;

7. Reverse voltage frequency: DC

8. All modules are manually connected and tested in single-device form.

9. Computer-controlled, with sampling and display;