Scanning Electron Microscope Calibration
Price:Negotiable
Contact Info
- Address:廣東省深圳市南山區(qū)西麗街道陽(yáng)光社區(qū)松白路1008號(hào)港鴻基高新智能產(chǎn)業(yè)園B棟103, Zip: 518000
- Contact: 吳新輝
- Tel:13530743695
- Email:[email protected]
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Description
Additional Information
Scanning Electron Microscope Calibration Specification:
"Scanning Electron Microscope Calibration Specification JJF 1916", "Analytical Scanning Electron Microscope Verification Regulation JJG (Education Commission) 010"
Instrument Calibration Parameters:
1) Magnification
10X~50000X, 50000X~300000X, 300000X~1000000X
2) Length
100nm~500nm, 500nm~1μm, 1μm~10μm
3) Electron Energy
(125~155) eV
4) Content
(0.1~100)%
5) Angle
(0～360)°
| Industry Category: | Instruments & Meters/Optical Instruments/Microscopes |
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