Ci52 Multifunctional Spectrophotometer
Contact Info
- Address:東繡路999弄8號1506室, Zip:
- Contact: 李國軍 先生
- Tel:021-50595116
- Email:[email protected]
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Ci52
Quality Control Instrument
X-Rite CiTM52
Versatile Spectrophotometer
The spectrophotometer can measure samples of different materials, sizes, shapes, textures, and transparencies while ensuring consistent measurement results. Simultaneous measurement of color and appearance enhances accuracy. This device can be used with a hanging handle or assembled into a compact benchtop instrument. Enabling the Netprofiler3 system ensures stable and precise performance.
Advantages of X-Rite Ci52
Comprehensive Functionality - Offers both handheld and benchtop operation modes; equipped with a remote port for more convenient measurement control options.
Easy Operation - Visual (LED) and audio status indicators provide real-time feedback on operation status.
More Complete Measurement Methods - With a lowered flip-down positioning plate and remote port control, difficult-to-handle samples can be measured easily.
Wider Range of Sample Types and Sizes - Paper, plastic, fabric with sizes ≥14mm; various hard surfaces.
Fast and Accurate Readings - Measurement time is 2 seconds for both standard flat samples and complex-shaped samples.
Reliable Performance - Comprehensive measurement modes: including specular reflection (color) and excluding specular reflection (appearance) to determine the impact of specular factors.
Consistent Results - Excellent compatibility ensures high consistency in color control across various instrument combinations.
NetProfiler?3 Enabled - Onboard system optimizes instrument performance and enables remote certification.
Seamless Integration - Operates in the same manner as existing X-Rite spectrophotometers.
X-Rite Ci52 Specifications
| Optical Measurement System | d/8°, DRS spectral sensor Simultaneous SPIN/SPEX measurement |
| Optical Measurement Aperture | 8mm measurement area 14mm measurement target window |
| Light Source | Gas-filled tungsten lamp |
| Receiver | Silicon photodiode (blue-enhanced) |
| Spectral Range | 400-700nm |
| Spectral Wavelength Interval | 10nm - Measurement 10nm - Output |
| Measurement Range | 0-200% Reflectance |
| Measurement Time | Approx. 2 seconds |
| Inter-Instrument Agreement | CIE L*a*b*; Average 0.20ΔE*ab, measured on 12 BCRA II series color tiles (including specular reflection); Maximum 0.40ΔE*ab, measured on any tile (including specular reflection) |
| Short-Term Repeatability | 0.05ΔE*ab, measured on white standard tile |
| NetProfiler Support | Embedded |
| Transform Support | Embedded |
| Lamp Life | Approx. 500,000 measurements |
| Power Supply | Power adapter requirements: 90-130VAC or 100-240VAC, 50-60Hz, 15W max |
| Data Interface | USB |
| Operating Temperature Range | 50° to 104°F (10° to 40°C) Max relative humidity: 85% (non-condensing) |
| Storage Temperature Range | -4° to 122°F (-20° to 50°C) |
| Weight | 1.9 lbs (0.87 kg) |
| Dimensions | 4.3″ H (10.9 cm) × 3.6″ W (9.1 cm) × 8.4″ L (21.3 cm) |
| Standard Accessories | Calibration standards: Black calibration standard, removable white and green standard tiles; User manual, AC adapter, USB cable |
| Optional Accessories | Optional benchtop sample holding fixture |
| Industry Category: | Others |
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